Particulate discrete element analysis is becoming increasingly popular for research in geomechanics as well as geology, chemical engineering, powder technology, petroleum engineering and in studying the physics of granular materials. With increased computing power, practising engineers are also becoming more interested in using this technology for analysis in industrial applications. This is the first single work on Discrete Element Modelling (DEM) providing the information to get started with this powerful numerical modelling approach.
Written by an independent author with experience both in developing DEM codes and using commercial codes, this book provides the basic details of the numerical method and the approaches used to interpret the results of DEM simulations. Providing a basic overview of the numerical method, Particulate Discrete Element Modelling discusses issues related to time integration and numerical stability, particle types, contact modelling and boundary conditions. It summarizes approaches to interpret DEM data so that users can maximize their insight into the material response using DEM. The aim of this book is to provide both users and prospective users of DEM with a concise reference book that includes tips to optimize their usage.
Particulate Discrete Element Modelling is suitable both for first time DEM analysts as well as more experienced users. It will be of use to professionals, researchers and higher level students, as it presents a theoretical overview of DEM as well as practical guidance on running DEM simulations and interpreting DEM simulation data.
Practicing designers, students, and educators in the semiconductor field face an ever expanding portfolio of MOSFET models. In "Compact MOSFET Models for VLSI Design," A.B. Bhattacharyya presents a unified perspective on the topic, allowing the practitioner to view and interpret device phenomena concurrently using different modeling strategies. Readers will learn to link device physics with model parameters, helping to close the gap between device understanding and its use for optimal circuit performance. Bhattacharyya also lays bare the core physical concepts that will drive the future of VLSI development, allowing readers to stay ahead of the curve, despite the relentless evolution of new models.
Adopts a unified approach to guide students through the confusing array of MOSFET models Links MOS physics to device models to prepare practitioners for real-world design activities Helps fabless designers bridge the gap with off-site foundries Features rich coverage of: quantum mechanical related phenomena Si-Ge strained-Silicon substrate non-classical structures such as Double Gate MOSFETs Presents topics that will prepare readers for long-term developments in the field Includes solutions in every chapter Can be tailored for use among students and professionals of many levels Comes with MATLAB code downloads for independent practice and advanced study
This book is essential for students specializing in VLSI Design and indispensible for design professionals in the microelectronics and VLSI industries. Written to serve a number of experience levels, it can be used either as a course textbook or practitioner's reference.
Access the MATLAB code, solution manual, and lecture materials at the companion website: www.wiley.com/go/bhattacharyya
The use of simulation modeling and analysis is becoming increasingly more popular as a technique for improving or investigating process performance. This book is a practical, easy-to-follow reference that offers up-to-date information and step-by-step procedures for conducting simulation studies. It provides sample simulation project support material, including checklists, data-collection forms, and sample simulation project reports and publications to facilitate practitioners' efforts in conducting simulation modeling and analysis projects.
Drawing on 25 years of experience as a salesman, sales manager, and training consultant, David Stumm provides a thoughtful analysis of the sales training process--where it succeeds, why it fails, and what is lacking in current practice--and presents field-tested techniques for creating an effective training program. The book is built around three concepts: reading what is happening in any sales situation; recognizing situational need areas as a common theme in all sale techniques development; and building sales strategies that blend selling techniques into an integrated effort. Each chapter explains the theory behind a different sales skill and translates it into specific sales applications.
It's been over a decade since the first edition of Measurement Error in Nonlinear Models splashed onto the scene, and research in the field has certainly not cooled in the interim. In fact, quite the opposite has occurred. As a result, Measurement Error in Nonlinear Models: A Modern Perspective, Second Edition has been revamped and extensively updated to offer the most comprehensive and up-to-date survey of measurement error models currently available.
What's new in the Second Edition?
Â· Greatly expanded discussion and applications of Bayesian computation via Markov Chain Monte Carlo techniques
Â· A new chapter on longitudinal data and mixed models
Â· A thoroughly revised chapter on nonparametric regression and density estimation
Â· A totally new chapter on semiparametric regression
Â· Survival analysis expanded into its own separate chapter
Â· Completely rewritten chapter on score functions
Â· Many more examples and illustrative graphs
Â· Unique data sets compiled and made available online
In addition, the authors expanded the background material in Appendix A and integrated the technical material from chapter appendices into a new Appendix B for convenient navigation. Regardless of your field, if you're looking for the most extensive discussion and review of measurement error models, then Measurement Error in Nonlinear Models: A Modern Perspective, Second Edition is your ideal source.
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